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parsed(2011-12-13) - pubdate: 2011-12-13
turn:
pub date: 1323756000
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nyp: 0;

Secondary Ion Mass Spectrometry Sims II

Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (Sims II) Stanford Univ

by A Benninghoven, C a Jr Evans, R a Powell
December 13, 2011 | Trade Paperback
ISBN: 9783642618734
$173.50
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Description

Science / Chemistry / Industrial & Technical Science / Chemistry / Analytic Photography

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About this Author

ISBN: 9783642618734
Format: Trade Paperback
Series: Springer Chemical Physics
Pages: 300
Publisher: Springer
Published: 2011-12-13

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